JUNO DTS-1000 测试系统说明书
2
目录
1 测试项目表（精度及范围）
1.0 通用项目
1.1 晶体管
1.2 FET
1.3 二极管
1.3.1 L.E.D
1.4 三端稳压器
1.4.1 Shut Regulator
1.4.2 Voltage Regulator
1.4.3 Low Drop Low Noise Voltage Regulator
1.5 半导体闸流管、可控硅器件
2 测试原理
2.0 共用项目原理
2.0.1 Contact Check [CONT]
2.0.2 Contact Check [CONT2]
2.0.3 D.U.T Pin Short [SHORTS]
2.0.4 LV-Detector offset [VDOFFSET]
2.0.5 Battery Check [BATTCHK]
2.1 晶体管
2.1.1 Leakage Current [ICBO(S)，ICEO(S)，IEB]
2.1.2 Leakage Current [HILCBO(S)，HICEO(S)，HILEB]
2.1.3 Leakage Current [ICEX]
2.1.4 Breakdown Voltage [BVCBO(S)，BVCEO(S)，BVEB]
2.1.5 Breakdown Voltage [BVCEX]
2.1.6 D.C Gain [IB，HFE]
2.1.7 Base Turn on Voltage [BTON]
2.1.8 Saturation Voltage [VFBC，VFBE，VFEC]
2.1.9 Forward Voltage [VFBC，VFBE，VVFEC]
2.2 FET
2.2.1 Leakage Current [IDGO(S)，IDSO(S)]
2.2.2 Leakage Current [IGSX]
2.2.3 Leakage Current [HIDSS]
2.2.4 Leakage Current [IDSX]
2.2.5 Breakdown Voltage [BVDGO(S)，BVDSO(S)，BVSG]
2.2.6 Breakdown Voltage [BVDSX]
2.2.7 Pinch-off Voltage [VB]
2.2.8 Threshold Voltage [VTH]
2.2.9 Drain-Source Voltage [VDSON]
2.2.10 On Resistance [RDON]
2.2.11 On Current [IDON]
2.2.12 Forward Voltage [VFGD，VFGS，VFSD(S)]
2.2.13 YFS [GMP]
2.2.14 YFS [GMV]
2.2.15 YFS [GMI]…………

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DTS1000测试系统资料.pdf