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Credence D10_mannual_1.5.1

时间:2010-01-14 19:24来源:未知 作者:ictest8 点击:

  System Overview
  The Credence Diamond 10 test system is a low-cost, high throughput production solution for testing very cost-sensitive devices. Its small footprint and low-power consumption also make the test system ideal for personal use in the lab or office. See Figure 1 for a graphic of the system. High-density digital, analog, and mixed-signal instruments are ideal for testing devices in a number of application areas, such as wireless baseband, microcontrollers, and display drivers. The infrastructure of the system lends itself to high-throughput, multi-site testing in a final test or wafer sort environment, while remaining ideal for lab bench work.
  Ten-Slot System for Personal and Production Test

  The system leverages many of the best features, functions and technologies from Credence’s industry-leading product portfolio, offering customers the clear-cut advantage in test economics. Specifically designed to address the test challenges of low-cost consumer devices, the system is extended to address a
broader application space with innovative technology and test economics. Based on Credence’s patented technologies, the system is revolutionary in leveraging core Credence intellectual property (IP) with industry-standard infrastructure to integrate more features, functions, and performance into an
ultra-compact, air-cooled test system. The system’s modular architecture scales from desktop debug and characterization to high volume multi-site production on the same system, a concept first pioneered by Credence.
  The high-throughput instrumentation and architecture of the system have been designed with high volume production and massive multi-site testing in mind, dramatically lowering cost of test. With up to 768 200 Mbps digital channels and a mix of high-density analog and mixed-signal instruments, the system is a perfect fit for multi-site wafer sort or final test production. The system comes complete with a full suite of customer-driven software tools for test creation, debug, characterization, and high-volume production.
  The software provides superior test economics due to its fast run times and efficient multi-site capabilities. Cost-sensitive integrated circuits (ICs) require cost-effective test systems. The system is designed to provide ease of development with the best value in its class today. The use of industry-standards has resulted in a lower cost, more reliable tester.

 

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